Image SXM 184

Image SXM is a version of the public domain image analysis software NIH Image that has been extended to handle the loading, display and analysis of scanning microscope images.
Image SXM is a tool that supports SAM, SCM, SEM, SFM, SLM, SNOM, SPM and STM images from the following systems:
- Burleigh Instruments
- Digital Instruments NanoScope II/III/IV
- DME Rasterscope/Surface Data File
- Gatan DigitalMicrograph
- JEOL JSM/WinSem/WinSPM
- JPK Instruments
- Klocke Nanotechnik Atomikro
- Leica TCS
- LEO SEM
- Molecular Imaging PicoScan
- Nanotec Electronica WSxM
- Noran Instruments Vantage
- NT-MDT
- Omicron SCALA
- Oxford Instruments TOPSystem
- Park Scientific Instruments HFS-LIF/HDF
- Philips SEM
- Quesant Instruments
- RHK Technology SPM-32
- Seiko Instruments (SIINT) SPI
- ThermoMicroscopes
- TopoMetrix SPMLab
- Unisoku
- Vacuum Generators SAM
- WA Technology
- Zeiss LSM
 
In addition, the following non-SXM file formats are also supported:
• AVI
• Bio-Rad
• BMP
• FITS
• Omicron SPA-LEED
• PDSF
• PDSS
• Philips APD
• SBIG CCD
• SM-Camera
• SPEC
• Targa TGA
• UBM
• Wyko OPD
Enhancements:
- Support for RHK Technology XPM Pro SPM images
- Support for NEF images from the Nikon D200 DSLR (compressed and uncompressed)
- New Mineral Phase Analysis item calculates the relative areas of two phases in mineral grains
- New Particulate Matter Analysis item calculates the relative areas of particulate matter in cells
- Split SPECS STM Aarhus image files into separate files, one image per file
- Gatan DigitalMicrograph v3 images now open with calibrated xy scales
- When reslicing a stack a rectangular region of interest can be selected (rather than a line)